Abstract #300922


The views expressed here are those of the individual authors
and not necessarily those of the ASA or its board, officers, or staff.


Back to main JSM 2002 Program page



JSM 2002 Abstract #300922
Activity Number: 184
Type: Contributed
Date/Time: Tuesday, August 13, 2002 : 8:30 AM to 10:20 AM
Sponsor: Section on Quality & Productivity*
Abstract - #300922
Title: On a Class of Distribution-free Control Charts
Author(s): Subha Chakraborti*+ and Paul van der Laan and Mark van de Wiel
Affiliation(s): University of Alabama and Eindhoven University of Technology and Eindhoven University of Technology
Address: Box 870226, Tuscaloosa, Alabama, 35487,
Keywords: Qauntiles ; Order statistics ; False alarm rate ; Average run length ; nonparametric ; Estimated control limits
Abstract:

A class of Shewhart-type control charts is studied. A key advantage of these distribution-free charts is that the in-control run length distribution is the same for all continuous process distributions. Various properties of the charts are studied via evaluations of the run length distribution and the ARL. It is seen that from a robustness point of view, the proposed charts are preferable to the classical Shewhart charts and, in fact, they have attractive ARL properties over other standard parametric charts in certain situations.


  • The address information is for the authors that have a + after their name.
  • Authors who are presenting talks have a * after their name.

Back to the full JSM 2002 program

JSM 2002

For information, contact meetings@amstat.org or phone (703) 684-1221.

If you have questions about the Continuing Education program, please contact the Education Department.

Revised March 2002