Abstract #300559

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JSM 2002 Abstract #300559
Activity Number: 313
Type: Contributed
Date/Time: Wednesday, August 14, 2002 : 10:30 AM to 12:20 PM
Sponsor: Section on Physical & Engineering Sciences*
Abstract - #300559
Title: Operating Window Experiments: A Novel Approach to Quality and Reliability Improvement
Author(s): V. Joseph*+ and Jeff Wu
Affiliation(s): University of Michigan and University of Michigan
Address: 4062 Frize Building, Ann Arbor, Michigan, 48109, USA
Keywords: Robust Parameter Design ; Performance Measure ; Optimization ; Signal-to-Noise Ratio ; Sequential Design
Abstract:

The operating window method is a novel tool in quality engineering. It has been practiced in some industrial sectors but has received scant attention in academic research. If a critical factor for competing failure modes can be identified, the probability of failures can be reduced by widening the operating window of this factor, thus improving the system's quality and reliability. A rigorous foundation is given for some existing practice, particularly the operating window SN ratio. A new strategy is given for design, analysis and system optimization, which improves over existing practice. Illustration is given with the analysis of a wave soldering experiment.

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Revised March 2002