JSM Activity #126

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Activity ID:  126
Title Room
* Robust Experimental Design M-Madrid/Trinidad
Date / Time Sponsor Type
08/06/2001    2:00 PM  -  3:50 PM Section on Quality & Productivity*, Section on Physical & Engineering Sciences* Topic Contributed
Organizer: Angela Neff, General Electric Corporate Research and Development
Chair: Tim Keyes, General Electric Company
Discussant:  
Floor Discussion 3:45 PM
Description

Designing experiments with the objective of making products and systems robust, focusing on run reduction, multiple targets, time trend effects and multiple responses. Both Taguchi and response model methods are presented.
  301224  By:  Angela Neff 2:05 PM 08/06/2001
Reducing the Number of Experimental Runs in Taguchi Inner-Outer Array Designs

  301548  By:  Mary McShane-Vaughn 2:25 PM 08/06/2001
The Effect of Response-Model Estimator Bias on Loss Function Optimization

  300714  By:  V. Roshan Joseph 2:45 PM 08/06/2001
Robust Parameter Design of Multiple Target Systems

  300891  By:  Lieven Tack 3:05 PM 08/06/2001
Nonparametric Time Trends in Optimum Design

  301097  By:  Christopher Stanard 3:25 PM 08/06/2001
Optimization of Z Scores in Multiple Response DOEs for Robust Design

JSM 2001

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Revised March 2001