|
Activity Number:
|
253
- Contributed Poster Presentations: Section on Statistical Computing
|
|
Type:
|
Contributed
|
|
Date/Time:
|
Monday, July 30, 2018 : 2:00 PM to 3:50 PM
|
|
Sponsor:
|
Section on Statistical Computing
|
|
Abstract #328609
|
|
|
Title:
|
Package MTEXO for Testing the Presence of Outliers in Exponential Samples
|
|
Author(s):
|
Chien-Tai Lin*
|
|
Companies:
|
Tamkang University
|
|
Keywords:
|
Critical value;
discordancy test;
exponential distribution;
spacings;
user interface
|
|
Abstract:
|
We develop a user-interface package mTEXO in the maplet application for testing exponential upper and/or lower outliers. The distributions of some well-known test statistics for exponential outliers in the literature can be easily evaluated using mTEXO, saving considerable computational time performing numerical integrations and combinatorial algebra necessary in the traditional approach.
|
Authors who are presenting talks have a * after their name.
