Activity Number:
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324
- Leading with Statistics: Process Monitoring and Improvement
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Type:
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Invited
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Date/Time:
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Tuesday, July 31, 2018 : 10:30 AM to 12:20 PM
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Sponsor:
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Quality and Productivity Section
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Abstract #326496
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Presentation
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Title:
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Using Baseline Data in Process Improvement
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Author(s):
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Stefan Steiner* and Jock MacKay
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Companies:
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University of Waterloo and University of Waterloo
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Keywords:
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experimental design;
process monitoring;
SPC;
measurement system assessment
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Abstract:
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For many existing industrial/business processes data on responses of interest are routinely collected. In this talk we explore and quantify the benefits of using this "free" baseline data to improve both the planning and analysis of process monitoring charts, measurement system assessment studies and designed experiments.
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Authors who are presenting talks have a * after their name.