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Sessions Were Renumbered as of May 19.

CC-W = McCormick Place Convention Center, West Building,   CC-N = McCormick Place Convention Center, North Building
H = Hilton Chicago,   UC= Conference Chicago at University Center
* = applied session       ! = JSM meeting theme

Activity Details

29 * ! Sun, 7/31/2016, 2:00 PM - 3:50 PM CC-W181a
Reliability, Degradation, and Competing Risks — Contributed Papers
Quality and Productivity Section , Section on Physical and Engineering Sciences
Chair(s): Ming Li, Walmart
2:05 PM Degradation Analysis with Measurement Errors Chien-Yu Peng, Institute of Statistical Science, Academia Sinica
2:20 PM Bayesian Estimation and Variable Selection for Reliability in Multicomponent Systems Yiqing Tian, North Carolina State University ; Howard Bondell, North Carolina State University ; Alyson Wilson, North Carolina State University
2:35 PM Frequentist and Bayesian Simulation Using a Random Coefficients Model to Establish Shelf-Life Specification Limits for a Drug Product Richard Montes, Hospira, a Pfizer Company ; David LeBlond, CMCStats
2:50 PM Guardbanding Techniques for the Semiconductor Industry: A Comparative Study Thomas Nowak, University of Graz ; Vera Hofer, University of Graz ; Johannes Leitner, University of Graz ; Horst Lewitschnig , Infineon Technologies Austria AG
3:05 PM Statistical Lifetime Inference Based on Skew-Normal Accelerated Destructive Degradation Test Model Chih-Chun Tsai, Tamkang University ; Chien-Tai Lin, Tamkang University
3:20 PM Component Integrated Importance: Modeling Complex Aging Systems Peng Liu, SAS Institute ; Leo Wright, SAS Institute
3:35 PM Floor Discussion
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