Sessions Were Renumbered as of May 19.
Legend:
CC-W = McCormick Place Convention Center, West Building,
CC-N = McCormick Place Convention Center, North Building
H = Hilton Chicago,
UC = Conference Chicago at University Center
* = applied session ! = JSM meeting theme
Activity Details
29 * !
Sun, 7/31/2016,
2:00 PM -
3:50 PM
CC-W181a
Reliability, Degradation, and Competing Risks — Contributed Papers
Quality and Productivity Section , Section on Physical and Engineering Sciences
Chair(s): Ming Li, Walmart
2:05 PM
Degradation Analysis with Measurement Errors
—
Chien-Yu Peng, Institute of Statistical Science, Academia Sinica
2:20 PM
Bayesian Estimation and Variable Selection for Reliability in Multicomponent Systems
—
Yiqing Tian, North Carolina State University ; Howard Bondell, North Carolina State University ; Alyson Wilson, North Carolina State University
2:35 PM
Frequentist and Bayesian Simulation Using a Random Coefficients Model to Establish Shelf-Life Specification Limits for a Drug Product
—
Richard Montes, Hospira, a Pfizer Company ; David LeBlond, CMCStats
2:50 PM
Guardbanding Techniques for the Semiconductor Industry: A Comparative Study
—
Thomas Nowak, University of Graz ; Vera Hofer, University of Graz ; Johannes Leitner, University of Graz ; Horst Lewitschnig , Infineon Technologies Austria AG
3:05 PM
Statistical Lifetime Inference Based on Skew-Normal Accelerated Destructive Degradation Test Model
—
Chih-Chun Tsai, Tamkang University ; Chien-Tai Lin, Tamkang University
3:20 PM
Component Integrated Importance: Modeling Complex Aging Systems
—
Peng Liu, SAS Institute ; Leo Wright, SAS Institute
3:35 PM
Floor Discussion
