Sessions Were Renumbered as of May 19.
Legend:
CC-W = McCormick Place Convention Center, West Building,
CC-N = McCormick Place Convention Center, North Building
H = Hilton Chicago,
UC = Conference Chicago at University Center
* = applied session ! = JSM meeting theme
645 *
Thu, 8/4/2016,
8:30 AM -
10:20 AM
CC-W175c
Maintenance, Monitoring, and Inference: Different Aspects of Reliability Modeling in Industrial Applications — Topic Contributed Papers
Quality and Productivity Section , Section on Physical and Engineering Sciences
Organizer(s): Ananda Sen, University of Michigan
Chair(s): Nandini Kannan, National Science Foundation
8:35 AM
The EM Algorithm for One-Shot Device Testing with Competing Risk Under Different Lifetimes Distributions
—
Hon Yiu So, McMaster University ; Narayanaswamy Balakrishnan, McMaster University ; Man Ho Ling, Hong Kong Institute of Education
8:55 AM
Degradation and Maintenance Modeling Using the Inverse Gaussian Process
—
Bo Henry Lindqvist, Norwegian University of Science and Technology ; Odd Eirik Farestveit, Accenture
9:15 AM
Reliability Monitoring in a Mass-Production Environment
—
Emmanuel Yashchin, IBM Research
9:35 AM
Discussant: Ravindra Khattree, Oakland University
9:55 AM
Floor Discussion
