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Activity Number:
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192
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Type:
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Contributed
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Date/Time:
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Monday, August 1, 2016 : 10:30 AM to 12:20 PM
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Sponsor:
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Quality and Productivity Section
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Abstract #318575
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Title:
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Advanced Process Capability: Avoiding the Pitfalls
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Author(s):
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Scott Wise*
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Companies:
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JMP
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Keywords:
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Process Capability
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Abstract:
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Process Capability statistical methods are vital for ensuring that new products and processes meet increasingly complex design specifications. However, many applying Process Capability often fall into common pitfalls in properly applying these methods and interpreting the results. This paper will help uncover the ways to avoid the traps and get the most out of your Process Capability studies, including understanding: - When to use short vs long term capability approaches. - Where to use non-parametric capability solutions. - How to compare multiple process capability measures at once. - Why visual statistical tools can augment process capability to uncover deeper learning. Relevant case studies will be used to demonstrate these advanced Process Capability techniques.
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Authors who are presenting talks have a * after their name.
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