JSM 2011 Online Program

The views expressed here are those of the individual authors and not necessarily those of the JSM sponsors, their officers, or their staff.

Abstract Details

Activity Number: 256
Type: Contributed
Date/Time: Monday, August 1, 2011 : 2:00 PM to 3:50 PM
Sponsor: Section on Statistical Learning and Data Mining
Abstract - #303055
Title: Multi-Label Classification via Binary Markov Networks
Author(s): Jie Cheng*+
Companies: University of Michigan
Address: 1085 S University Ave, Ann Arbor, MI, 48109,
Keywords: multi-label classification ; binary markov networks ; pseudo likelihood
Abstract:

Multi-label classification refers to the scenario in classification that each instance is associated with a subset of labels rather than one. The labels are not mutually exclusive and often correlated. In this project, we first propose to transform multi-label classification into a multivariate binary regression problem. Then we introduce an Ising model with covariates to explicitly model the conditional distribution of the class labels given the covariates. Pseudo-likelihood is adopted to develop a computationally efficient estimation procedure. We also investigate the choice of evaluation measures in connection to different prediction rules, which is further illustrated by numerical studies. The proposed method is applied to a popular Yeast dataset and shows promising result.


The address information is for the authors that have a + after their name.
Authors who are presenting talks have a * after their name.

Back to the full JSM 2011 program




2011 JSM Online Program Home

For information, contact jsm@amstat.org or phone (888) 231-3473.

If you have questions about the Continuing Education program, please contact the Education Department.