JSM 2011 Online Program

The views expressed here are those of the individual authors and not necessarily those of the JSM sponsors, their officers, or their staff.

Abstract Details

Activity Number: 661
Type: Contributed
Date/Time: Thursday, August 4, 2011 : 10:30 AM to 12:20 PM
Sponsor: Section on Statistical Computing
Abstract - #301977
Title: An Adaptive Particle Allocation Scheme for Offline Sequential Importance Sampling Algorithms
Author(s): Anindya Bhadra*+ and Edward L. Ionides
Companies: Texas A & M University and University of Michigan
Address: 3143 TAMU, College Station, TX, 77843, USA
Keywords: Adaptive particle allocation ; Particle filters ; Sequential Monte Carlo
Abstract:

In presence of extreme observations, evaluation of conditional likelihood by a Sequential Monte Carlo filter (also known as a particle filter) suffers from high variance at the corresponding time points, resulting in poor Monte Carlo estimate of the overall likelihood. This paper develops a novel strategy for particle allocation for off-line Sequential Monte Carlo (SMC) based filters, in order to reduce the overall variance of the likelihood estimate. The complications arising from the intractability of the actual SMC variance is handled indirectly by modeling the conditional log likelihood of the observations as an autorgressive process. We demonstrate numerical results on both simulated and real data sets where adaptive particle allocation results in close to 50% lower overall variance over the naive equal allocation of particles at all time points. The technique presented in this article is quite general and applicable to many off-line SMC based optimization techniques.


The address information is for the authors that have a + after their name.
Authors who are presenting talks have a * after their name.

Back to the full JSM 2011 program




2011 JSM Online Program Home

For information, contact jsm@amstat.org or phone (888) 231-3473.

If you have questions about the Continuing Education program, please contact the Education Department.