Testing for Electrical Leakage: A Bayes/Empirical Bayes Approach

• Activity Number: 576
• Type: Contributed
• Date/Time: Wednesday, August 3, 2011 : 2:00 PM to 3:50 PM
• Sponsor: Section on Physical and Engineering Sciences
• Author(s): Cheng Chung Chen*+ and Hongbin Chen
• Companies: Texas A & M University at Kingsville and Academia Sinica
• Keywords: Circuit Testing ; Group Testing ; Bayes Estimation ; Empirical Bayes ; Networks

Abstract

This paper considers the problem of detecting and locating electrical leakage between two groups of nets. This problem was previously considered by Skilling (1982) and a clever method was patented by him with complexity of O(n). Chen and Hwang (1989) improved the complexity to O(2log2N) by using group testing results. Notice that both of the above two approaches are deterministic in nature. Furthermore, it was observed that only a very small subset of networks can be close enough to possibly short together during the manufacturing process as evidenced by failure data. The current study uses the Bayes /Empirical Bayes techniques to capture the topological structure of the network and defect data base adaptively. We The proposed procedure compares favorably with both Chen& Hwang and Skilling's method. The complexity is bounded above by 2l?og?_2?n. Furthermore, is also consider the case in which one of the two groups of nets being tested is restricted in size, as is true in most practical applications.