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Abstract Details
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Activity Number:
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497
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Type:
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Topic Contributed
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Date/Time:
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Wednesday, August 3, 2011 : 10:30 AM to 12:20 PM
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Sponsor:
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Section on Physical and Engineering Sciences
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| Abstract - #301572 |
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Title:
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Analysis And Modeling Of Data From An Accelerated Destructive Degradation Test With Batch-To-Batch Variability
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Author(s):
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Necip Doganaksoy*+ and Ming Li
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Companies:
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General Electric and GE Global Research
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Address:
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One Research Circle, Niskayuna, NY, 12309,
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Keywords:
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lognormal distribution ;
reliability ;
variance components estimation
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Abstract:
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Accelerated Destructive Degradation Tests (ADDT) are commonly used in industry to speedily gather life and reliability information on new materials and components. Standard statistical models and software can be used for effective analysis of most data sets from ADDTs. In our work involving a new battery component, the initial analysis of the data based on standard ADDT models suggested the presence of an additional source of variability that was not represented in the standard model. In this presentation we will describe our attempt at estimating the contribution of this batch-to-batch variability and its practical implications.
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