JSM 2011 Online Program

The views expressed here are those of the individual authors and not necessarily those of the JSM sponsors, their officers, or their staff.

Abstract Details

Activity Number: 578
Type: Contributed
Date/Time: Wednesday, August 3, 2011 : 2:00 PM to 3:50 PM
Sponsor: Section on Survey Research Methods
Abstract - #301064
Title: Goodness of Fit Tests in Dual-Frame Surveys
Author(s): Yan Lu*+ and Sharon Lohr
Companies: University of New Mexico and Arizona State University
Address: Mathematics and Statistics Department, University , Albuquerque, NM, 87131,
Keywords: dual frame surveys ; longitudinal quantities ; goodness of fit tests ; simulations
Abstract:

Traditionally, large surveys use a single sampling frame from which the sample is selected. As the population and methods used to collect survey data change, single frame surveys may miss parts of the population. In order to obtain better coverage of the population of interest and cost less, a number of surveys employ dual frame surveys, in which independent samples are taken from two overlapping sampling frames. Some current surveys follow the same households at regular time intervals so that longitudinal quantities such as transitions in employment status can be studied. In this research, statistical methods for analyzing longitudinal quantities from dual frame surveys are reviewed. Goodness of fit (GOF) tests to assess the model fit are developed. Statistical properties of the GOF tests are investigated. Simulation studies and real data example are given to illustrate the developed tests.


The address information is for the authors that have a + after their name.
Authors who are presenting talks have a * after their name.

Back to the full JSM 2011 program




2011 JSM Online Program Home

For information, contact jsm@amstat.org or phone (888) 231-3473.

If you have questions about the Continuing Education program, please contact the Education Department.