This is the program for the 2010 Joint Statistical Meetings in Vancouver, British Columbia.
Activity Details
679 * ! | Thu, 8/5/2010, 10:30 AM - 12:20 PM | CC-203 (West) |
Reliability Analysis and Yield Modeling — Contributed Papers | ||
Section on Quality and Productivity | ||
Chair(s): William F. Guthrie, National Institute of Standards and Technology | ||
10:35 AM | Bayesian Methods for Supercomputer Reliability Data — Sarah Michalak, Los Alamos National Laboratory ; Todd Graves, Los Alamos National Laboratory ; Lori Pritchett-Sheats, Los Alamos National Laboratory | |
10:50 AM | Bayesian Analysis of Multistage Process Yields — Patrick J. Gaffney, ImClone Systems ; Alan Richter, ImClone Systems | |
11:05 AM | Hierarchical Approach to Yield Modeling: Applications of GLMs — Christina Mastrangelo, University of Washington | |
11:20 AM | Random Contamination of Semiconductor Materials — Bernard Harris, University of Wisconsin | |
11:35 AM | Field-Failure and Warranty Prediction Based on Auxiliary Use-Rate Information — Yili Hong, Virginia Tech ; William Q. Meeker, Iowa State University | |
11:50 AM | Reliability Analysis Based on Warranty Data with Sale and Report Lag — Shuen-Lin Jeng, National Cheng Kung University | |
12:05 PM | Optimal Age Replacement Time with Minimal Repair Based on Cumulative Repair-Cost Limit for a System Subjected to Shocks — Shey-Huei Sheu, Providence University ; Chin-Chih Chang, Providence University ; Yu-Hung Chien, National Taichung Institute of Technology |
2010 JSM Online Program Home
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