This is the program for the 2010 Joint Statistical Meetings in Vancouver, British Columbia.
Abstract Details
Activity Number:
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77
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Type:
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Contributed
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Date/Time:
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Sunday, August 1, 2010 : 4:00 PM to 5:50 PM
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Sponsor:
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Section on Physical and Engineering Sciences
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Abstract - #309057 |
Title:
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Flexible Distribution Modeling and Efficient Test Effort Allocation in Inkjet Pen Development
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Author(s):
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Robert O'Donnell*+
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Companies:
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Hewlett-Packard
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Address:
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1000 NE Circle Blvd, Corvallis, OR, 97330,
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Keywords:
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Gamma-Poisson ;
Monte-Carlo ;
Reliability ;
Test ;
Allocation
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Abstract:
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Inkjet pen development generates a wide range of data which at times do not lend themselves to convenient distribution models (e.g. normal, binomial, Poisson). Mixture distributions like the Gamma-Poisson are shown to provide valuable flexibility to the data analysis process.
Budgeting for reliability testing in product development can involve making test effort allocation tradeoffs among different tests. A process incorporating historical reliability information, Monte Carlo simulation, cost-to-test data, and cost-to-fix data is developed to quantify these decisions.
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Authors who are presenting talks have a * after their name.
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