This is the program for the 2010 Joint Statistical Meetings in Vancouver, British Columbia.
Abstract Details
Activity Number:
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181
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Type:
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Contributed
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Date/Time:
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Monday, August 2, 2010 : 10:30 AM to 12:20 PM
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Sponsor:
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Section on Quality and Productivity
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Abstract - #308141 |
Title:
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G-EWMAG Control Chart for High-Quality Processes
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Author(s):
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Chang Wook Kang*+ and Jae-Won Baik and Hae-Woon Kang and Min Song
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Companies:
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Hanyang University and Hanyang University and Hanyang University and Hanyang University
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Address:
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1271 Sa 3 dong, Sangrok ku, Ansan, 426-791, Republic of Korea
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Keywords:
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Average run length ;
G control chart ;
G-EWMAG control chart ;
alpha ratio
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Abstract:
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G control chart is used to monitor and detect any change in high-quality processes. This control chart is based on plotting of G statistic which is the number of conforming units that comes out between two consecutive non-conforming units. However, there are some drawbacks in G control chart applying to high-quality processes, as it has low performance in detecting small shifts. The EWMA control chart is widely used in order for detecting small shift. In this paper, G-EWMAG control chart is proposed to detect small shifts in the high-quality processes. The run length properties of G-EWMAG control chart are studied and compared with G control chart at different fraction non-conforming units and process shifts. G-EWMAG control chart with alpha ratio smaller than 0.3 is efficient for small shift. Finally, the implementation of G-EWMA is illustrated in one real-world example.
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