Reliability Models for Single Repairable Systems and Some Nonstandard Inference

• Activity Number: 165
• Type: Topic Contributed
• Date/Time: Monday, August 2, 2010 : 10:30 AM to 12:20 PM
• Sponsor: Section on Quality and Productivity
• Author(s): Ananda Sen*+
• Companies: University of Michigan
• Keywords: Repairable system ; Non-homogeneous Poisson process ; Single shot systems ; Asymptotics ; Competing risks

Abstract

In this talk, I shall focus on analysis of failure data from a single repairable system. The most typical context is one that comprises of a complex and expensive manufacturing system that is undergoing a developmental testing program. I shall discuss some widely used parametric models both under continuous time to failure framework as well as discrete single shot systems that yields dichotomous outcomes. I shall highlight some nonstandard features in a class of such models under the classical likelihood based inference procedures. Some extension to the multiple failure mode analysis under a competing risks framework will also be presented.