This is the program for the 2010 Joint Statistical Meetings in Vancouver, British Columbia.
Abstract Details
Activity Number:
|
165
|
Type:
|
Topic Contributed
|
Date/Time:
|
Monday, August 2, 2010 : 10:30 AM to 12:20 PM
|
Sponsor:
|
Section on Quality and Productivity
|
Abstract - #307880 |
Title:
|
Reliability Models for Single Repairable Systems and Some Nonstandard Inference
|
Author(s):
|
Ananda Sen*+
|
Companies:
|
University of Michigan
|
Address:
|
Department of Family Medicine, Ann Arbor, MI, 48104-1213,
|
Keywords:
|
Repairable system ;
Non-homogeneous Poisson process ;
Single shot systems ;
Asymptotics ;
Competing risks
|
Abstract:
|
In this talk, I shall focus on analysis of failure data from a single repairable system. The most typical context is one that comprises of a complex and expensive manufacturing system that is undergoing a developmental testing program. I shall discuss some widely used parametric models both under continuous time to failure framework as well as discrete single shot systems that yields dichotomous outcomes. I shall highlight some nonstandard features in a class of such models under the classical likelihood based inference procedures. Some extension to the multiple failure mode analysis under a competing risks framework will also be presented.
|
The address information is for the authors that have a + after their name.
Authors who are presenting talks have a * after their name.
Back to the full JSM 2010 program
|
2010 JSM Online Program Home
For information, contact jsm@amstat.org or phone (888) 231-3473.
If you have questions about the Continuing Education program, please contact the Education Department.