This is the program for the 2010 Joint Statistical Meetings in Vancouver, British Columbia.
Abstract Details
Activity Number:
|
667
|
Type:
|
Contributed
|
Date/Time:
|
Thursday, August 5, 2010 : 10:30 AM to 12:20 PM
|
Sponsor:
|
Section on Physical and Engineering Sciences
|
Abstract - #306711 |
Title:
|
Metrological Characteristics of Ordinal Data
|
Author(s):
|
Tamar Gadrich+ and Emil Bashkansky*
|
Companies:
|
Ort Braude College and Ort Braude College
|
Address:
|
P.O.Box 78, Karmiel, 21982, Israel
|
Keywords:
|
ordinal scale ;
error ;
uncertainty ;
repeatability ;
agreement ;
calibration
|
Abstract:
|
Although some measurements can be made on any scale (including a continual scale), cost and speed considerations sometimes tip the scales toward using ordinal measurements. This paper presents a way to evaluate classical metrological characteristics, such as error, uncertainty and precision of single and repeated measurements based on the legitimate basic operations for ordinal data. The only legitimate measurement operations among ordinal variables are limited to equal or greater than/less than; the usual assessment measures such as average, standard deviation cannot be applied. Consequently, in order to receive reliable results and draw valid conclusions from ordinal measurements it is essential to develop and use only the appropriate methods. We consider also essential for many applications methods of comparison between two measurement systems.
|
The address information is for the authors that have a + after their name.
Authors who are presenting talks have a * after their name.
Back to the full JSM 2010 program
|
2010 JSM Online Program Home
For information, contact jsm@amstat.org or phone (888) 231-3473.
If you have questions about the Continuing Education program, please contact the Education Department.