This is the program for the 2010 Joint Statistical Meetings in Vancouver, British Columbia.
Abstract Details
Activity Number:
|
475
|
Type:
|
Contributed
|
Date/Time:
|
Wednesday, August 4, 2010 : 8:30 AM to 10:20 AM
|
Sponsor:
|
Section on Quality and Productivity
|
Abstract - #306591 |
Title:
|
A Multivariate Control Chart Increases in Process Dispersion
|
Author(s):
|
Chia-Ling Yen*+ and Jyh-Jen Horng Shiau+
|
Companies:
|
National Chiao Tung University and National Chiao Tung University
|
Address:
|
4F., Joint Education Hall, Hsinchu,, 300, Taiwan 4F., Joint Education Hall, Hsinchu, 300, Taiwan
|
Keywords:
|
Average run length ;
Likelihood ratio test ;
Multivariate process dispersion ;
One-sided test ;
Two-sided test
|
Abstract:
|
For signalling alarms sooner when the dispersion of a multivariate process is "increased", a multivariate control chart for Phase II process monitoring is proposed as a supplementary tool to the usual monitoring schemes designed for detecting general changes in the covariance matrix. The proposed chart is constructed based on the one-sided likelihood ratio test (LRT) for testing the hypothesis that the covariance matrix of the quality characteristic vector of the current process is "larger" than that of the in-control process. The LRT statistic is derived and then used to construct the control chart. A simulation study shows that the proposed control chart indeed outperforms three existing two-sided-test-based control charts under comparison in terms of the average run length. The applicability and effectiveness of the proposed chart are demonstrated through a semiconductor example.
|
The address information is for the authors that have a + after their name.
Authors who are presenting talks have a * after their name.
Back to the full JSM 2010 program
|
2010 JSM Online Program Home
For information, contact jsm@amstat.org or phone (888) 231-3473.
If you have questions about the Continuing Education program, please contact the Education Department.