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Activity Number:
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368
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Type:
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Contributed
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Date/Time:
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Tuesday, August 4, 2009 : 2:00 PM to 3:50 PM
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Sponsor:
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Section on Quality and Productivity
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| Abstract - #303234 |
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Title:
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CUSUM Charts for Monitoring Lifetime Data
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Author(s):
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Denisa A. Olteanu*+ and Geoff G. Vining
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Companies:
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Virginia Polytechnic Institute and State University and Virginia Polytechnic Institute and State University
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Address:
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403P Hutcheson Hall, Dept of Statistics, Blacksburg, VA, 24061,
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Keywords:
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Lifetime Data ; Reliability ; Quality Control ; Control Charts ; Censored Data ; Weibull
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Abstract:
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Companies routinely perform life tests for their products. Typically, these tests involve running a set of products until some (the censored case) or all (the uncensored case) fail. Reliability professionals use a number of non-normal distributions to model the resulting lifetime data, the Weibull distribution being the most frequently used. This paper proposes CUSUM charts for lifetime data, monitoring for shifts in the Weibull distribution shape and scale parameters. The CUSUM charts are constructed using a sequential probability ratio test approach for both uncensored and censored lifetime data.
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