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Activity Number: 95
Type: Topic Contributed
Date/Time: Monday, July 30, 2007 : 8:30 AM to 10:20 AM
Sponsor: ENAR
Abstract - #309013
Title: Semiparametric Analysis of Correlated Recurrent and Terminal Events
Author(s): Yining Ye*+ and John D. Kalbfleisch and Douglas Schaubel
Companies: Amgen Inc. and University of Michigan and University of Michigan
Address: 1120 Veterans Blvd, South San Francisco, CA, 94080,
Keywords: Survival Analysis ; Recurrent Event ; Semi-parametric analysis
Abstract:

In clinical and observational studies, an event can recur on the same subject, and in a more complicated situation, there exists a terminal event (e.g. death), which stops the recurrent event process. In many instances, the terminal event is strongly correlated with the recurrent event process. I propose a semiparametric method to jointly model the recurrent and terminal event processes. The dependence is modeled by a shared gamma frailty that is included in both the recurrent event rate and terminal event hazard function. Marginal models are used to estimate the regression effects on the terminal and recurrent event processes. Different from the existing frailty approaches, we relax the Poisson assumption. Then we extend the analysis to model multiple types of recurrent events and terminal events.


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Revised September, 2007