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Activity Number:
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317
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Type:
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Invited
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Date/Time:
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Tuesday, July 31, 2007 : 2:00 PM to 3:50 PM
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Sponsor:
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Section on Physical and Engineering Sciences
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| Abstract - #308088 |
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Title:
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Challenges Related to Reliability and Statistics in Nano Electronics
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Author(s):
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Way Kuo and Tao Yuan*+
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Companies:
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University of Tennessee and University of Tennessee
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Address:
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Department of Industrial and Information Engineering, Knoxville, TN, 37996-0700,
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Keywords:
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reliability ; nano electronics
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Abstract:
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To Build for the Future, we must achieve major advances related to reliability in addition to exploring and discovering interdisciplinary connections in important cutting-edge research areas. The technologies for today's design and manufacturing have for some time been steadily moving from the realm of the micro- to the nano scale, but advancements in reliability and statistics have not kept up with the pace. In this presentation, we will talk about modeling and analysis for reliability of nano electronics.
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