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Activity Number:
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269
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Type:
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Invited
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Date/Time:
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Tuesday, July 31, 2007 : 10:30 AM to 12:20 PM
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Sponsor:
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Section on Risk Analysis
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| Abstract - #307794 |
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Title:
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Overarching Issues in Risk Analysis
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Author(s):
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Duane Steffey*+ and Bruce Craig*+ and Robert Obenchain*+ and Walter W. Piegorsch*+
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Companies:
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Exponent, Inc. and Purdue University and Eli Lilly and Company and The University of Arizona
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Address:
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149 Commonwealth Drive, Menlo Park, CA, 94025, 150 North University Street , West Lafayette , IN, 47907-2067, , Indianapolis, IN, 46285-0001, BIO5 Institute, Tucson, AZ, 85721,
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Keywords:
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data quality ; exposure assessment ; cost prediction ; model validation ; risk perception ; multiple scales
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Abstract:
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Given the increasing diversification of research on risk analysis, and especially the expanding multiplicity of contexts in which risk analysis is being used, the panel will attempt to articulate broad statistical issues in risk analysis that span multiple contexts. Possible examples of such issues are: Data quality, which threatens all risk analyses, and which is typically not incorporated into uncertainty characterizations; Principled tradeoffs among data, modeling and computation; Exposure assessment, especially in emerging contexts such as food safety; Cost prediction--because there is associated "physics," more attention is devoted to predicting system behavior than predicting costs.
The panel will inform the planned SAMSI 2007-08 program on Risk Analysis, Extreme Events and Decision Theory.
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- The address information is for the authors that have a + after their name.
- Authors who are presenting talks have a * after their name.
Back to the full JSM 2007 program |
