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Keyword Search Criteria: auto- and cross-distance covariance returned 1 record(s)
Tuesday, 08/01/2017
On Testing Goodness-of-Fit of AR(P) Model Through the Serial Dependence of the Residual Process
Phyllis Wan, Columbia University; Richard A. Davis, Columbia University; Muneya Matsui, Nanzan University; Thomas Mikosch, University of Copenhagen
11:20 AM

 
 
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