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Abstract:
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Accelerated degradation tests are often used to quickly find the life of materials such as electrical insulators. An ADT consists of several high levels of stress and the number of samples at that level. Each sample is subjected to the stress for a certain evaluation time and the degradation rate at that time is measured. The time when the deterioration reaches a certain threshold is regarded as the failure time. The lifetime can be predicted from the obtained failure time data under the assumption that the physical law is empirically established between the stress and the lifetime and the logarithmic lifetime follows a specific probability distribution under a certain stress. In this research, focusing on finding the optimum sample allocation number, consider the case where the number of stress levels is three. By considering the linearity of the relational equation between stress and lifetime, we show a more reasonable interpretation of setting to 3 stress levels. In order to consider the reality, we use the mathematical model obtained from actual experimental data and its parameter value.
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