|
Abstract:
|
The accelerated degradation test (ADT) is an efficient tool for assessing the lifetime information of highly reliable products. Without taking the experimental cost into consideration, recently, an analytical approach was proposed in the literature to determine the optimum stress levels and the corresponding optimum sample size allocation simultaneously in a general class of exponential dispersion (ED) degradation models. However, conducting an ADT is very expensive. Therefore, how to conduct a cost-constrained ADT plan is a great challenging issue for reliability analysts. By taking the experimental cost into consideration, this study further proposes a semi-analytical procedure to determine the total sample size, the measurement frequencies, and the number of measurements (within a degradation path) globally under the class of ED degradation models. An example is used to demonstrate that our proposed method is very efficient to obtain the cost-constrained ADT plan, compared with the conventional optimum plan by the grid search algorithm.
|
