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Sessions Were Renumbered as of May 19.

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CC-W = McCormick Place Convention Center, West Building,   CC-N = McCormick Place Convention Center, North Building
H = Hilton Chicago,   UC= Conference Chicago at University Center
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Keyword Search Criteria: Computerized Testing returned 1 record(s)
Sunday, 07/31/2016
Bayesian Joint Modeling of Response Times with Dynamic Latent Ability in Educational Testing
Abhisek Saha, University of Connecticut; Xiaojing Wang, University of Connecticut; Dipak Dey, University of Connecticut
4:05 PM

 
 
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