This is the program for the 2010 Joint Statistical Meetings in Vancouver, British Columbia.

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Keyword Search Criteria: reliability returned 25 record(s)
Sunday, 08/01/2010
An Overview of the ISU - LANL Collaboration: Research and Impact
Christine M. Anderson-Cook, Los Alamos National Laboratory
2:05 PM

American Community Survey Sample Size Research
Steven Hefter, U.S. Census Bureau
2:05 PM

Investigation of Data Release Rules for Medians and Zero Estimates for the American Community Survey
Karen Ellen King, U.S. Census Bureau
3:25 PM

Reliability Data Analysis for Designed Experiments
Laura June Freeman, Virginia Tech; Geoffrey Vining, Virginia Tech
4:05 PM

Flexible Distribution Modeling and Efficient Test Effort Allocation in Inkjet Pen Development
Robert O'Donnell, Hewlett-Packard
4:20 PM

A Life-Time Model with Random Number of Components in a Series System
Ram C. Tripathi, The University of Texas at San Antonio; Ramesh C. Gupta, University of Maine
4:35 PM

Monday, 08/02/2010
Reliability of Relative Standard Errors Computed from NHDS Public Use Data Files
Bill Cai, National Center for Health Statistics; Iris Shimizu, National Center for Health Statistics


Comparison of Cure Rate Models in Competing Risks Framework
Sanjib Basu, Northern Illinois University; Suchitrita Sarkar, Northern Illinois University
10:35 AM

Reliability Models for Single Repairable Systems and Some Nonstandard Inference
Ananda Sen, University of Michigan
11:35 AM

How to Estimate Measurement Error Variance Associated with Ancestry Proportion Estimates
Jasmin Divers, Wake Forest University Health Sciences; David T. Redden, The University of Alabama at Birmingham; Raymond J. Carrol, Texas A&M University; David B. Allison, The University of Alabama at Birmingham
3:05 PM

Tuesday, 08/03/2010
The Inextricability of Reliability and Interfactor Correlation
Peter H. Westfall, Texas Tech University; Kevin S.S. Henning, Texas Tech University
9:55 AM

Wednesday, 08/04/2010
An Examination of Reliability of Text Mining
Chong Ho Yu, Arizona State University; Angel Jannasch-Pennell, Arizona State University; Samuel DiGangi, Arizona State University


Reliability and Misclassification in Physician Profiling
John L. Adams, RAND Corporation


Some Censoring Issues Regarding the Reliability of Load-Sharing Systems
James Lynch, University of South Carolina; John M. Grego, University of South Carolina; Shuang Li, Fred Hutchinson Cancer Research Center; Jayaram Sethuraman, Florida State University
8:55 AM

Accelerated Reliability Testing in a Field Study
Maria Weese, Institute for Statistical Engineering; Steve Fox, Aera Energy, LLC; Mary Leitnaker, Institute for Statistical Engineering; Deanna Starbuck, Aera Energy, LLC
9:05 AM

Confidence Interval Estimation for Inter-Rater Reliability in a Two-Factor Random-Effects Design
Joseph C. Cappelleri, Pfizer Inc.; Kelly H. Zou, Pfizer Inc.; Carmen Arteaga, Pfizer Inc.; Naitee Ting, Boehringer Ingelheim Pharmaceuticals, Inc.
9:20 AM

Optimal Design for Consistent Rating of Classroom Instructions
Yongyun Shin, Virginia Commonwealth University; Stephen W. Raudenbush, The University of Chicago
9:20 AM

The Reliability of Signal Analysis in the Adverse Events Setting of Priorities
Qian Graves, FDA/CFSAN; Peng T. Liu, FDA; Stuart Chirtel, FDA/CFSAN; Curtis Barton, FDA/CFSAN; Debra Street, FDA/CFSAN
9:20 AM

Automobile Warranty Data Analysis
Jaiwook Baik, Korea National Open University
9:50 AM

Thursday, 08/05/2010
Conditional Moments of P(Y
Mohammed A. Shayib, Prairie View A&M University; Aliakbar Montazer Haghighi, Prairie View A&M University
9:35 AM

Using Latent Class Models to Better Understand Reliability in Measures of Labor Force Status
Bac Tran, U.S. Census Bureau
9:55 AM

Bayesian Methods for Supercomputer Reliability Data
Sarah Michalak, Los Alamos National Laboratory; Todd Graves, Los Alamos National Laboratory; Lori Pritchett-Sheats, Los Alamos National Laboratory
10:35 AM

Estimating Reliabilities for Complex Systems Using Multilevel and Multitype Information
Jiqiang Guo, Iowa State University; Alyson Wilson, Iowa State University
11:05 AM

Field-Failure and Warranty Prediction Based on Auxiliary Use-Rate Information
Yili Hong, Virginia Tech; William Q. Meeker, Iowa State University
11:35 AM

Reliability Analysis Based on Warranty Data with Sale and Report Lag
Shuen-Lin Jeng, National Cheng Kung University
11:50 AM




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