JSM 2010 Online Program

*679 !**	Thu, 8/5/2010, 10:30 AM - 12:20 PM	CC-203 (West)
Reliability Analysis and Yield Modeling — Contributed Papers
Section on Quality and Productivity
Chair(s): William F. Guthrie, National Institute of Standards and Technology
10:35 AM	Bayesian Methods for Supercomputer Reliability Data — Sarah Michalak, Los Alamos National Laboratory ; Todd Graves, Los Alamos National Laboratory ; Lori Pritchett-Sheats, Los Alamos National Laboratory
10:50 AM	Bayesian Analysis of Multistage Process Yields — Patrick J. Gaffney, ImClone Systems ; Alan Richter, ImClone Systems
11:05 AM	Hierarchical Approach to Yield Modeling: Applications of GLMs — Christina Mastrangelo, University of Washington
11:20 AM	Random Contamination of Semiconductor Materials — Bernard Harris, University of Wisconsin
11:35 AM	Field-Failure and Warranty Prediction Based on Auxiliary Use-Rate Information — Yili Hong, Virginia Tech ; William Q. Meeker, Iowa State University
11:50 AM	Reliability Analysis Based on Warranty Data with Sale and Report Lag — Shuen-Lin Jeng, National Cheng Kung University
12:05 PM	Optimal Age Replacement Time with Minimal Repair Based on Cumulative Repair-Cost Limit for a System Subjected to Shocks — Shey-Huei Sheu, Providence University ; Chin-Chih Chang, Providence University ; Yu-Hung Chien, National Taichung Institute of Technology

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